Please use this identifier to cite or link to this item:
http://idr.niser.ac.in:8080/jspui/handle/123456789/652Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bhakta, Sourav | - |
| dc.contributor.author | Sahoo, Pratap Kumar | - |
| dc.date.accessioned | 2024-07-16T06:25:27Z | - |
| dc.date.available | 2024-07-16T06:25:27Z | - |
| dc.date.issued | 2024-06 | - |
| dc.identifier.uri | http://idr.niser.ac.in:8080/jspui/handle/123456789/652 | - |
| dc.language.iso | en | en_US |
| dc.publisher | NISER Bhubaneswar | en_US |
| dc.relation.ispartofseries | Theses;T622 | - |
| dc.title | Ion beam-induced defect phenomena in rock-salt crystals (MgO, NiO) for optical and electronic device applications | en_US |
| dc.type | Thesis | en_US |
| Appears in Collections: | School of Physical Sciences | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| T622_Sourav Bhakta_PHYS11201705005.pdf | 37.63 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.