Please use this identifier to cite or link to this item:
https://idr.niser.ac.in/jspui/handle/123456789/652| Title: | Ion beam-induced defect phenomena in rock-salt crystals (MgO, NiO) for optical and electronic device applications |
| Authors: | Bhakta, Sourav Sahoo, Pratap Kumar |
| Issue Date: | Jun-2024 |
| Publisher: | NISER Bhubaneswar |
| Series/Report no.: | Theses;T622 |
| URI: | https://idr.niser.ac.in/jspui/handle/123456789/652 |
| Appears in Collections: | School of Physical Sciences |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| T622_Sourav Bhakta_PHYS11201705005.pdf | 37.63 MB | Adobe PDF | View/Open |
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